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EM-Tec F12 is a basic yet practical FIB grid holder with pin for 2 FIB grids. Based on the standard Ø12.7mm pin stub it is compact and useful for storing valuable samples. The 10mm wide vise clamp includes a ledge for easy positioning of the FIB grids
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EM-Tec F25 is a larger FIB grid holder with a M4 threaded hole which can accommodate up to 4 FIB grids of the same thickness. The 25mm wide vise include a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vise
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EM-Tec F25 is a larger FIB grid holder with pin which can accommodate up to 4 FIB grids of the same thickness. The 25mm wide vise include a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vise.
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EM-Tec FS21 combines the EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2) pin stubs. The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples
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EM-Tec FS21 combines the EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2) pin stubs. The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples
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EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples.
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EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples
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EM-Tec FS25 with pin M4 thread. Combines the the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from form lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts.
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EM-Tec FS25 with pin stub. Combines the the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from form lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts.
